• JEDEC JESD51-50

JEDEC JESD51-50

Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-PN-Junction Light-Emotting Diodes (LEDs)

JEDEC Solid State Technology Association, 04/18/2012

Publisher: JEDEC

File Format: PDF

$26.00$53.00


Published:18/04/2012

Pages:12

File Size:1 file , 73 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This document provides an overview of the methodology necessary for making meaningful thermal measurements on high-power light-emitting diodes (LEDs) built on single or multiple chips with one or more pn-junctions per chip. The actual methodology components are contained in separate detailed documents.

More JEDEC standard pdf

JEDEC JESD241

JEDEC JESD241

Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities

$37.00 $74.00

JEDEC JESD245

JEDEC JESD245

Byte Addressable Energy Backed Interface

$81.00 $163.00

JEDEC JESD235A

JEDEC JESD235A

HIgh Bandwidth Memory (HBM) DRAM

$104.00 $208.00

JEDEC JESD232

JEDEC JESD232

Graphics Double Data Rate (GDDR5X) SGRAM Standard

$104.00 $208.00