• JEDEC JESD51-50

JEDEC JESD51-50

Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-PN-Junction Light-Emotting Diodes (LEDs)

JEDEC Solid State Technology Association, 04/18/2012

Publisher: JEDEC

File Format: PDF

$26.00$53.00


Published:18/04/2012

Pages:12

File Size:1 file , 73 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This document provides an overview of the methodology necessary for making meaningful thermal measurements on high-power light-emitting diodes (LEDs) built on single or multiple chips with one or more pn-junctions per chip. The actual methodology components are contained in separate detailed documents.

More JEDEC standard pdf

JEDEC JESD66 (R2006)

JEDEC JESD66 (R2006)

TRANSIENT VOLTAGE SUPPRESSOR STANDARD FOR THYRISTOR SURGE PROTECTIVE DEVICE

$58.00 $116.00

JEDEC JESD80

JEDEC JESD80

STANDARD FOR DESCRIPTION OF 2.5 V CMOS LOGIC DEVICES

$24.00 $48.00

JEDEC JESD625-A

JEDEC JESD625-A

REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES

$36.00 $72.00

JEDEC JEP70B

JEDEC JEP70B

QUALITY AND RELIABILITY STANDARDS AND PUBLICATIONS

$37.00 $74.00