• Your shopping cart is empty!

  • JEDEC JESD51-51

JEDEC JESD51-51

Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impedance of Light-emitting Diodes with Exposed Cooling Surface

JEDEC Solid State Technology Association, 04/18/2012

Publisher: JEDEC

File Format: PDF

$36.00$72.00


Published:18/04/2012

Pages:12

File Size:1 file , 1 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

The purpose of this document is to specify, how LEDs's thermal metrics and other thermally-related data are best identified by physical measurements using well established testing procedures defined for thermal testing of packaged semiconductor devices (published and maintained by JEDEC) and defined for characterization of light sources (published and maintained by CIE ? the International Commission on Illumination).

More JEDEC standard pdf

JEDEC EIA 323 (R2002)

JEDEC EIA 323 (R2002)

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

$25.00 $51.00

JEDEC JESD306 (R2009)

JEDEC JESD306 (R2009)

MEASUREMENT OF SMALL SIGNAL HF, VHF, AND UHF POWER GAIN OF TRANSISTORS

$24.00 $48.00

JEDEC JESD340 (R2009)

JEDEC JESD340 (R2009)

STANDARD FOR THE MEASUREMENT OF CRE

$27.00 $54.00

JEDEC JESD6 (R2002)

JEDEC JESD6 (R2002)

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

$29.00 $59.00