• JEDEC JESD531 (R2002)

JEDEC JESD531 (R2002)

THERMAL RESISTANCE TEST METHOD FOR SIGNAL AND REGULATOR DIODES (FORWARD VOLTAGE, SWITCHING METHOD)

JEDEC Solid State Technology Association, 07/01/1986

Publisher: JEDEC

File Format: PDF

$29.00$59.00


Published:01/07/1986

Pages:18

File Size:1 file , 580 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard describes a test method for measuring the thermal resistance of signal and regulator diodes. The need for modification of this test method arose out of the limited description that existed earlier for both signal and regulator diode applications in testing for thermal resistance. Previously published as ID-13. ANSI/EIA-531-1986 (July) expired June 1996. Became JESD531 after reaffirmation April 2002.

More JEDEC standard pdf

JEDEC JESD 82-26

JEDEC JESD 82-26

DEFINITION OF THE SSTUB32868 REGISTERED BUFFER WITH PARITY FOR 2R x 4 DDR2 RDIMM APPLICATIONS

$37.00 $74.00

JEDEC JESD 82-24

JEDEC JESD 82-24

DEFINITION OF the SSTUB32865 28-bit 1:2 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS

$36.00 $72.00

JEDEC JESD82-9B

JEDEC JESD82-9B

DEFINITION OF SSTU32865 REGISTERED BUFFER WITH PARITY FOR 2R x 4 DDR2 RDIMM APPLICATIONS

$33.00 $67.00

JEDEC JESD 82-23

JEDEC JESD 82-23

DEFINITION OF the SSTUA32S869 AND SSTUA32D869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS

$37.00 $74.00