• JEDEC JESD6 (R2002)

JEDEC JESD6 (R2002)

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

JEDEC Solid State Technology Association, 02/01/1967

Publisher: JEDEC

File Format: PDF

$29.00$59.00


Published:01/02/1967

Pages:17

File Size:1 file , 280 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.

More JEDEC standard pdf

JEDEC JEP 79

JEDEC JEP 79

LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS

$33.00 $67.00

JEDEC JESD 354 (R2009)

JEDEC JESD 354 (R2009)

THE MEASUREMENT OF TRANSISTOR EQUIVALENT NOISE VOLTAGE AND EQUIVALENT NOISE CURRENT AT FREQUENCIES OF UP TO 20 kHz

$25.00 $51.00

JEDEC JESD 353 (R2009)

JEDEC JESD 353 (R2009)

THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD

$25.00 $51.00

JEDEC JESD307 (R2002)

JEDEC JESD307 (R2002)

VOLTAGE REGULATOR DIODE NOISE VOLTAGE MEASUREMENT

$24.00 $48.00