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  • JEDEC JESD659B

JEDEC JESD659B

FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING

JEDEC Solid State Technology Association, 02/01/2007

Publisher: JEDEC

File Format: PDF

$28.00$56.00


Published:01/02/2007

Pages:15

File Size:1 file , 140 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This method establishes requirements for application of Statistical Reliability Monitoring 'SRM' technology to monitor and improve the reliability of electronic components and subassemblies. The standard also describes the condition under with a monitor may be replaced or eliminated. Formerly known as EIA-659, that superseded JESD29-A (July 1996). Became JESD625 after revision, September 1999.

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