JEDEC JESD659C

FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING

JEDEC Solid State Technology Association, 04/01/2017

Publisher: JEDEC

File Format: PDF

$28.00$56.00

Description

Published:01/04/2017

Pages:16

File Size:1 file , 170 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This method establishes requirements for application of Statistical Reliability Monitoring 'SRM' technology to monitor and improve the reliability of electronic components and subassemblies. The standard also describes the condition under with a monitor may be replaced or eliminated. Formerly known as EIA-659, that superseded JESD29-A (July 1996). Became JESD625 after revision, September 1999.

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