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JEDEC Solid State Technology Association, 07/01/2018
Publisher: JEDEC
File Format: PDF
$31.00$62.00
Published:01/07/2018
Pages:22
File Size:1 file , 220 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
Temperature Range and Measurement Standards for Components and Module
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Method for Developing Acceleration Models for Electronic Device Failure Mechanisms
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Recommended ESD-CDM Target Levels
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Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
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