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JEDEC Solid State Technology Association, 02/01/2007
Publisher: JEDEC
File Format: PDF
$39.00$78.00
Published:01/02/2007
Pages:37
File Size:1 file , 300 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
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Addendum No. 1 to JESD209A - LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM, 1.2 V I/O
FBDIMM: ADVANCED MEMORY BUFFER (AMB)
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FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
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