• JEDEC JESD74A

JEDEC JESD74A

EARLY LIFE FAILURE RATE CALCULATION PROCEDURE FOR SEMICONDUCTOR COMPONENTS

JEDEC Solid State Technology Association, 02/01/2007

Publisher: JEDEC

File Format: PDF

$39.00$78.00


Published:01/02/2007

Pages:37

File Size:1 file , 300 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the ELFR meets customers' requirements.

More JEDEC standard pdf

JEDEC JESD22-B101C

JEDEC JESD22-B101C

EXTERNAL VISUAL

$28.00 $56.00

JEDEC JESD22-A113G

JEDEC JESD22-A113G

PRECONDITIONING OF PLASTIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING

$29.00 $59.00

JEDEC JESD94B

JEDEC JESD94B

APPLICATION SPECIFIC QUALIFICATION USING KNOWLEDGE BASED TEST METHODOLOGY

$40.00 $80.00

JEDEC JESD22-A119A

JEDEC JESD22-A119A

LOW TEMPERATURE STORAGE LIFE

$25.00 $51.00