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JEDEC Solid State Technology Association, 07/01/2001
Publisher: JEDEC
File Format: PDF
$23.00$47.00
Published:01/07/2001
Pages:6
File Size:1 file , 30 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
Addendum No. 1 to 3D Stacked SDRAM
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RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
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Graphics Double Data Rate (GDDR5) SGRAM Standard
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Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices