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JEDEC Solid State Technology Association, 11/01/2009
Publisher: JEDEC
File Format: PDF
$95.00$191.00
Published:01/11/2009
Pages:128
File Size:1 file , 1.8 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
Compute Express Link (CXL™) Memory Module Base Standard
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Guideline for Evaluating Gate Switching Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion
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Guideline for Gate Oxide Reliability and Robustness Evaluation Procedures for Silicon Carbide Power MOSFETs
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