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JEDEC Solid State Technology Association, 06/01/2015
Publisher: JEDEC
File Format: PDF
$25.00$51.00
Published:01/06/2015
Pages:10
File Size:1 file , 61 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)
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STANDARD FOR DESCRIPTION OF LOW VOLTAGE TTL-COMPATIBLE CMOS LOGIC DEVICES
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GUIDELINE FOR MEASUREMENT OF ELECTRONIC PACKAGE INDUCTANCE AND CAPACITANCE MODEL PARAMETERS
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