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JEDEC Solid State Technology Association, 05/01/2007
Publisher: JEDEC
File Format: PDF
$40.00$80.00
Published:01/05/2007
Pages:43
File Size:1 file , 440 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) - LEAD (Pb) CONTENT
$30.00 $60.00
AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS
$40.00 $80.00
Addendum No. 1 to JESD209-4 - Low Power Double Data Rate 4 (LPDDR4)
0.6 V Low Voltage Swing Terminated Logic (LVSTL06)
$27.00 $54.00