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JEDEC Solid State Technology Association,
Publisher: JEDEC
File Format: PDF
$95.00$191.00
File Size:1 file , 28 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
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STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) - LEAD (Pb) CONTENT
$26.00 $53.00
ELECTROSTATIC DISCHARGE SENSITIVITY TESTING, HUMAN BODY MODEL (HBM) - COMPONENT LEVEL
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ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)
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