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JEDEC Solid State Technology Association, 05/01/2003
Publisher: JEDEC
File Format: PDF
$29.00$59.00
Published:01/05/2003
Pages:17
File Size:1 file , 410 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
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Graphics Double Data Rate (GDDR5) SGRAM Standard
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Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices
FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
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