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JEDEC Solid State Technology Association, 06/01/2007
Publisher: JEDEC
File Format: PDF
$104.00$208.00
Published:01/06/2007
Pages:168
File Size:1 file , 3.3 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
TEST METHOD FOR REAL-TIME SOFT ERROR RATE
$28.00 $56.00
INFORMATION REQUIREMENTS FOR THE QUALIFICATION OF SILICON DEVICES
$27.00 $54.00
GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATION
$39.00 $78.00
CYCLED TEMPERATURE HUMIDITY BIAS LIFE TEST
$26.00 $53.00