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JEDEC Solid State Technology Association, 06/01/2012
Publisher: JEDEC
File Format: PDF
$142.00$284.00
Published:01/06/2012
Pages:264
File Size:1 file , 3.8 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
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IC LATCH-UP TEST
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Test Method for the Measurement of Moisture Diffusivity and Water Solubility in Organic Materials Used in Electronic Devices
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TS5111, TS5110 Serial Bus Thermal Sensor Device Standard
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