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JEDEC Solid State Technology Association, 06/01/2013
Publisher: JEDEC
File Format: PDF
$75.00$150.00
Published:01/06/2013
Pages:274
File Size:1 file , 1.4 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
STANDARD FOR DESCRIPTION OF 54/74ABTXXX AND 74BCXXX TTL-COMPATIBLE BiCMOS LOGIC DEVICES
$39.00 $78.00
METHODOLOGY FOR THE THERMAL MEASUREMENT OF COMPONENT PACKAGES (SINGLE SEMICONDUCTOR DEVICE)
$25.00 $51.00
ADDENDUM No. 2 to JESD35 - TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
$27.00 $54.00
INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)