JEDEC JESD89-2A

TEST METHOD FOR ALPHA SOURCE ACCELERATED SOFT ERROR RATE

JEDEC Solid State Technology Association, 10/01/2007

Publisher: JEDEC

File Format: PDF

$30.00$60.00

Description

Published:01/10/2007

Pages:19

File Size:1 file , 150 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This test method is offered as standardized procedure to determine the alpha particle Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flipflops) by measuring the error rate while the device is irradiated by a characterized, solid alpha source.

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