JEDEC JESD89-3A

TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATE

JEDEC Solid State Technology Association, 11/01/2007

Publisher: JEDEC

File Format: PDF

$36.00$72.00

Description

Published:01/11/2007

Pages:27

File Size:1 file , 220 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particleinduced SER.

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