• JEDEC JESD89-3A

JEDEC JESD89-3A

TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATE

JEDEC Solid State Technology Association, 11/01/2007

Publisher: JEDEC

File Format: PDF

$36.00$72.00


Published:01/11/2007

Pages:27

File Size:1 file , 220 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particleinduced SER.

More JEDEC standard pdf

JEDEC JS709C

JEDEC JS709C

Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products

$30.00 $60.00

JEDEC JESD8-21B

JEDEC JESD8-21B

POD135 - 1.35 V PSEUDO OPEN DRAIN I/O

$33.00 $67.00

JEDEC JESD248A

JEDEC JESD248A

DDR4 NVDIMM-N Design Standard

$40.00 $80.00

JEDEC JESD220-2A

JEDEC JESD220-2A

UNIVERSAL FLASH STORAGE (UFS) CARD EXTENSION

$31.00 $62.00