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  • JEDEC JESD89A

JEDEC JESD89A

MEASUREMENT AND REPORTING OF ALPHA PARTICLE AND TERRESTRIAL COSMIC RAY INDUCED SOFT ERRORS IN SEMICONDUCTOR DEVICES

JEDEC Solid State Technology Association, 10/01/2006

Publisher: JEDEC

File Format: PDF

$70.00$141.00


Published:01/10/2006

File Size:1 file , 730 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This specification defines the standard requirements and procedures for terrestrial soft-error-rate (SER)testing of integrated circuits and reporting of results. Both real-time (unaccelerated) and acceleratedtesting procedures are described. At terrestrial, Earth-based altitudes, the predominant sources of radiation include both cosmic-ray radiation and alpha-particle radiation from radioisotopic impurities in the package and chip materials. An overall assessment of a device¿¿s SER is complete, only when an unaccelerated test is done, or accelerated SER data for the alpha-particle component and the cosmic-radiation component has been obtained.

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