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JEDEC Solid State Technology Association, 04/01/2011
Publisher: JEDEC
File Format: PDF
$135.00$271.06
Published:01/04/2011
Pages:50
QUALITY SYSTEM ASSESSMENT (SUPERSEDES JESD39-A)
$40.00 $80.00
THERMAL TEST CHIP GUIDELINE (WIRE BOND TYPE CHIP)
$28.00 $56.00
TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
$43.00 $87.00
ADDENDUM No. 11 to JESD24 - POWER MOSFET EQUIVALENT SERIES GATE RESISTANCE TEST METHOD
$24.00 $48.00