Your shopping cart is empty!
JEDEC Solid State Technology Association, 03/01/2009
Publisher: JEDEC
File Format: PDF
$43.00$87.00
Published:01/03/2009
Pages:46
File Size:1 file , 3.7 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
STANDARD FOR DESCRIPTION OF 54/74ABTXXX AND 74BCXXX TTL-COMPATIBLE BiCMOS LOGIC DEVICES
$39.00 $78.00
METHODOLOGY FOR THE THERMAL MEASUREMENT OF COMPONENT PACKAGES (SINGLE SEMICONDUCTOR DEVICE)
$25.00 $51.00
ADDENDUM No. 2 to JESD35 - TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
$27.00 $54.00
INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)